Advanced Instrumentation

ELECTROCHEMICAL INSTRUMENTATION
 
several light-duty potentiostats for routine use
high current potentiostat
high frequency potentiostat (100,000 V/s)
low current sensitivity (pA range) potentiostat
electrochemical impedance system
ethernet-based potentiostat system
rotating disk electrode system
coulometry system
polarography system
quartz crystal nanobalance system
anodic stripping system
 
SPECTROSCOPY
 
Fourier transform infrared (FTIR) spectrometer
FT-Surface Plasmon Resonance spectrometer
Raman spectrometer
Phase Modulation-FTIR (PM-FTIR)
X-ray Photoelectron Spectrometer (XPS)
Auger Electron Spectrometer (Scanning - SAM)
Ion Scattering Spectrometer (ISS)
 
CHEMICAL ANALYSIS
 
Gas Chromatograph (GC)
High Performance Liquid Chromatograph (HPLC)
Liquid Chromatography - Mass Spectrometry (LC-MS)
Gas Chromatography - Mass Spectrometry (GC-MS)
 
MICROSCOPY
 
Atomic Force Microscope (AFM) - 3
Scanning Tunneling Microscope (STM) - 2
Interference Microscope
Surface Plasmon Resonance imaging system
FT-IR microscope
Raman imaging spectrometer
Image enhanced ellipsometer
 
OTHER
 
high & low temperature calorimetry
densimetry
conductance
 
Additional instrumentation for forming thin films by plasma deposition, sputter coating, spin coating and by spray pyrolysis.

 

 


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University of Guelph
Department of Chemistry
50 Stone Road East
Guelph, Ontario, N1G 2W1
Canada
519-824-4120 ext. 56709