S. Grabtchak Ph. D. thesis:

Study of Photoelectronic Properties of Semiconductors by the Advanced Method of Transient Microwave Photoconductivity (AMTMP)


Table of Contents

i. Abstract

ii. Acknowledgments

iii. Table of contents

iv. List of figures

v. List of tables

1. Introduction

2. Perturbation theory foundations of AMTMP

3. Experimental setup of AMTMP and related aspects.

3.1. The outline of the experiment.

3.2. Setup 1.

3.3. Setup 2.

3.4. Time-resolved measurement requirements.

3.5. Noise reduction and FFT.

4. Harmonic oscillator based analysis of bound/non-bound electron states - foundations.

4.1. Free electron effects.

4.2. Plasma effects.

4.3. Trapped electron effects.

4.4. Dominant contributions for AMTMP measurements.

5. Multiple trapping rate equation simulation for various forms of distribution of localized states.

5.1. Rectangular/linear distributions.

5.2. Exponential distribution.

5.3. Peaked Gaussian distribution.

6. Experimental results:

6.1. CdSe (#I)

6.2. CdSe (#II)

6.3. SI GaAs

6.4. Si

6.5. porous Si

7. Conclusions.

8. References


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