Silicon,
when anodized electrochemically or chemically in an HF-containing
electrolyte, is etched in a manner which produces a sponge-like
porous layer of silicon with pore dimensions that range from several
microns in width to only a few nanometers. As well, a thin amorphous
layer coats the walls in which are embedded small Si crystallites, a
few nanometers in diameter. Though porous silicon (poSi) had been
studied since the mid-1950's, it was only during the past decade that
a tremendous research activity was pursued following the observation
of its remarkable room temperature luminescence. The interpretation
of this phenomenon in terms of quantum confinement spurred scientific
interest while the potential for significant applications in flat
panel display technology and possibly in optoelectronics energized
its technological development. Porous silicon's fortune swelled and
receded many times as conflicting reports and opposing theories
passed into the literature. The model which enjoys the broadest
support focuses on the idea of a quantum confined nanostructure which
is strongly influenced by the presence of radiative and non-radiative
defect sites on its surface. However, a solid body of convincing
evidence has been presented in support of a purely defect model as
the origin of these optical phenomena. While early defect models
considered the role of polymeric SiHx and
Si(OH)x, the competing theory now expounds the role played
by an oxygen defect site, common to the Si/SiO2 interface,
called a non-bridging oxygen hole centre (NBOHC). In spite of this
tremendous research activity, the definitive experiment, to correlate
spectral emission properties with emission site (a quantum confined
silicon dot or some interfacial site) still remains to be done.
Our
work, over the past four years, has been in support of the quantum
confinement model. We have principally worked with the chemical
etching system (HNO3 and HF) rather than the more common
electrochemical system and have drawn attention to the chaotic
behaviour of the kinetics and the hillock structure (see SFM image to
the left; the image size is 20 x 20 µm) which is unique to the
chemical system. Of central importance is a series of experiments
involving the photoinduced chemical etching of porous silicon. We
have shown how the chemical reaction can be controlled by light and
that the frequency of the incident light affects the final emission
characteristics. By etching while irradiating the sample with light
of a shorter wavelength, the resulting material photoluminesces also
at a shorter wavelength. These ideas support the quantum model since
the photogeneration of holes inside a quantum dot is dependent upon
the local bandgap. As the particle becomes smaller as a result of the
etching process, the bandgap widens until absorption no longer occurs
and the reaction stops. Shorter wavelength light (higher energy) will
continue to be absorbed until the particle is even smaller (larger
bandgap). Such a smaller particle will also tend to photoluminesce at
shorter wavelength, since the bandgap is wider.
Another
aspect of this work is found in the epi-fluorescence microscope
images of the regions irradiated by the laser to induce the
photoetching process (the image on the right is about 200 µm
across at the bottom). The vast majority of poSi material is produced
electrochemically and so the chaotic kinetics of the chemical system
are not commonly observed. However, we have found that the chemical
system gives rise to spatial variations in the etching conditions so
that there are spatially separated regions which emit different
colors of lights. The overall spectrum is similar in width to those
observed traditionally, but it is clear that this is actually made up
from a distribution of emitters. While in electrochemically etched
material these emitters are uniformly distributed across the
material, in the chemical etching system they can be locally less
dispersed, so that regions which emit yellow are separate from those
which emit orange or red. Presumably, this suggests that the quantum
emitters in the yellow region are monodisperse in size and are
smaller than those in the orange or red emitting regions. This
pre-sorting of particle size by the chemical reaction provides us
with a unique opportunity to try to answer the important poSi
question regarding the correlation of emitter size with emission
wavelength.
We are working to convert our scanning probe microscopes (SPM: we have one from Burleigh Instruments and another from Topometrix) so that they can function as scanning near-field optical microscopes (SNOM) but operate specifically in a fluorescence collection mode. In this manner, the light can be collected from a 50 nm region and directed into a spectrometer to acquire the spectrum. We expect that the spectrum will be much narrower than the complete spectrum from the entire sample. Another possibility modifies this new probe even further by taking the probe tip and coating with a transparent conductor, such as In2O3. Now this probe tip can function as an scanning tunneling microscope (STM) tip. While an STM image can be acquired in normal fashion (others have shown that one can still obtain atomic resolution in this manner), a short voltage spike on the tip can inject a burst of high energy electrons into a particular object. Since this can induce electroluminescence, the probe tip can pick up the emitted fluorescence and acquire the spectrum. We hope that this may prove to be the critical experiment to correlate size with emission wavelength.